Complete Atomic Force Microscope system for small and medium size samplesconsisting of completely decoupled XY & Z scanners using flexure guided scan systemfor all three axes closed/open-loop scan zero background curvature XY flexure scannerXE AFM scanning head direct on-axis optics high resolution digital CCD camera withdigital zoom motorized Z focus stage manual precision XY sample stage electronicscontroller software and cantilevers.Includes the followings;